Refereed Publications
[Camattari 2020]
Camattari R., Romagnoni M., Bandiera L., Bagli E., Mazzolari A., Sytov A., Haaga S., Kabukcuoglu M., Bode S., Hänschke D., Danilewsky A., Baumbach T., Bellucci V., Guidi V., and Cavoto G.,
X-ray Characterization of Self-standing Bent Si Crystal Plates for Large Hadron Collider Beam Extraction,
Journal of Applied Crystallography 53, 486-493 (2020).
[Danilewsky 2020]
Danilewsky A. N.,
X-Ray Topography - More Than Nice Pictures,
Crystal Research & Technology (2020).
[Gradwohl 2020a]
Gradwohl K.-P., Danilewsky A. N., Roder M., Schmidbauer M., Janicskó-Csáthy J., Gybin A., Abrosimov N., and Sumathi R. R.,
Dynamical X-ray diffraction imaging of voids in dislocation-free high-purity germanium single crystals,
Journal of Applied Crystallography 53 (2020).
[Gradwohl 2020b]
Gradwohl K.-P., Gybin A., Janicskó-Csáthy J., Roder M., Danilewsky A. N., and Sumathi R. R.,
Vacancy Clustering in Dislocation-Free High-Purity Germanium,
Journal of Electronic Materials (2020).
[Steiner 2019]
Steiner J., Roder M., Nguyen B. D., Sandfeld S., Danilewsky A., and Wellmann P. J.,
Analysis of the Basal Plane Dislocation Density and Thermomechanical Stress during 100 mm PVT Growth of 4H-SiC,
Materials 12, 2207 (2019).
[Asadchikov 2018]
Asadchikov V., Buzmakov A., Chukhovsky F., Dyachkova I., Zolotov D., Danilewsky A., Baumbach T., Bode S., Haaga S., Hänschke D., Kabukcuoglu M., Balzer M., Caselle M., and Suvorov E.,
X-ray Topo-tomography Studies of Linear Dislocations in Silicon Single Crystals,
Journal of Applied Crystallography 51(6), 1616-1622 (2018).
[Hänschke 2018]
Hänschke D., Hamann E., and Baumbach T.,
Neuartiger Röntgenblick auf Kristallversetzungen,
Physik in unserer Zeit 49, 58-59 (2018).
[Redmond 2018]
Redmond K.,
Comprehensive approach enables 3D view of crystal dislocations,
MRS Bulletin 43, 11 (2018) - directly related to [Hänschke 2017].
[Farago 2017]
Faragó T., Mikulik P., Ershov A., Vogelgesang M., Hänschke D., and Baumbach T.,
syris: a flexible and efficient framework for X-ray imaging experiments simulation,
Journal of Synchrotron Radiation 24, 1283-1295 (2017).
[Hänschke 2017]
Hänschke D., Danilewsky A., Helfen L., Hamann E., and Baumbach T.,
Correlated Three-Dimensional Imaging of Dislocations: Insights into the Onset of Thermal Slip in Semiconductor Wafers,
Physical Review Letters 119, 215504 (2017) – Editors` Suggestion.
[Horton 2017]
Horton M. K.,
3D Imaging of Dislocations,
Viewpoint Article in Physics, (2017) – directly related to [Hänschke 2017].
[Rack 2017]
Rack A., Scheel M., and Danilewsky A. N.,
Real-time X-ray imaging of silicon wafer fracture,
ESRF Highlights 2016, 62-63 (2017).
[Asadchikov 2016]
Asadchikov V. E., Butashin A. V., Buzmakov A. V., Deryabin A. N., Kanevsky V. M., Prokhorov I. A., Roshchin B. S., Volkov Y. O., Zolotov D. A., Jafari A., Alexeev P., Cecilia A., Baumbach T., Bessas D., Danilewsky A. N., Sergueev I., Wille H.-C., and Hermann, R. P.,
Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators,
Crystal Research and Technology 51, 290 (2016).
[Rack 2016]
Rack, A., Scheel, M., and Danilewsky, A. N.,
Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage,
IUCrJ 3, 108 (2016).
[Rota 2016]
Rota L., Vogelgesang M., Ardila Perez L.E., Caselle M., Chilingaryan S., Dritschler T., Zilio N., Kopmann A., Balzer M., Weber M.,
A high-throughput readout architecture based on PCI-Express Gen3 and DirectGMA technology,
Journal of Instrumentation 11, P02007 (2016).
[Vogelgesang 2016]
Vogelgesang M., Farago T., Morgeneyer T. F., Helfen L., dos Santos Rolo T., Myagotin A., and Baumbach T.,
Real-time image-content-based beamline control for smart 4D X-ray imaging,
Journal of Synchrotron Radiation 23, 1254-1263 (2016).
[Vogelgesang 2016b]
Vogelgesang M., Rota L., Ardila Perez L. E. , Caselle M., Chilingaryan S., Kopmann A.,
High-throughput data acquisition and processing for real-time x-ray imaging,
Proc. of SPIE Vol. 9967, 996715-8 (2016).
[Chilingaryan 2015]
Chilingaryan S., Shkarin A., Shkarin R., Vogelgesang M., and Tsapko S.,
Benchmark for FFT Libraries,
Applied Mechanics and Materials 756, 673-677 (2015).
[Li 2015]
Li Z. J., Danilewsky A. N., Helfen L., Mikulik P., Hänschke D., Wittge J., Allen D., McNally P., and Baumbach T.,
Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging,
Journal of Synchrotron Radiation, 22, 1083-1090 (2015).
[Rota 2015]
Rota L., Caselle M., Chilingaryan S., Kopmann A., and Weber M.,
A PCIe DMA Architecture for multi-Gigabyte per Second Data Transmission,
IEEE Transactions on Nuclear Science 62, 972-976 (2015).
[Shkarin 2015]
Shkarin A., Ametova E., Kopmann A., Chilingaryan S., Shkarin R., Tsapko S., Dritschler T., and Vogelgesang M.,
An Open Source GPU Accelerated Framework for Flexible Algebraic Reconstruction at Synchrotron Light Sources,
Fundamenta Informaticae 141, 259-274 (2015).
[Shkarin 2015b]
Shkarin R., Ametova E., Chilingaryan S., Dritschler T., Kopmann A., Mirone A., Shkarin A., Tsapko S., and Vogelgesang M.,
GPU-optimized Direct Fourier Method for On-line Tomography,
Fundamenta Informaticae 141, 245-258 (2015).
[Stevanovic 2015]
Stevanovic U., Caselle M., Cecilia A., Chilingaryan S., Farago T., Gasilov S., Herth A., Kopmann A., Vogelgesang M., Balzer M., Baumbach T., and Weber M.,
A control system and streaming DAQ platform with image-based trigger for X-ray imaging,
IEEE Transactions on Nuclear Science 62, 911-918 (2015).
Invited Talks
Danilewsky A.,
Defect and Strain Characterisation in Single Crystals by Diffraction Imaging,
SFB-Kolloquium "Control and Dynamics of Quantum Materials", Sektion Kristallographie, Institut für Geologie und Mineralogie, Universität Köln, Köln, Germany, December 11, 2019.
Danilewsky A.,
Characterization of 1- and 2-Dimensional Defects in SiC,
1st Sino-German Symposium on "Defect Engineering in SiC Device Manufacturing - Atomistic Simulations, Characterization and Processing“, Beijing, China, November 10-14, 2019.
Danilewsky A.,
X-ray Diffraction Imaging: More than Nice Pictures,
Kolloquium, Leibnitz Institut für Kristallzüchtung IKZ, Berlin, Germany, March 19, 2018.
Danilewsky A.,
In-situ Characterization of Defect Dynamics in Semiconductors,
Empa - Materials Science and Technology, Dübendorf, Schweiz, April 3, 2017.
Talks, Posters, Not-refereed Proceedings, Conference Notes
Gradwohl K. P., Gybin K., Janicsko-Csathy J., Roder M., Danilewsky. A., and Sumathi M,
Formation of vacancy related defects in high-purity germanium,
Deutsche Kristallzüchtungstagung DKT-2020, München-Garching, March 11-13, 2020.
Hänschke D., Haaga S., Kabukcuoglu M., Bode S., Hamann H., Zuber M., Baumbach T., and Danilewsky A. (presenter),
Mobile Instrumentation Setup for X-ray Diffraction Imaging Applied at PETRA III,
European XFEL Users’ Meeting 2020, Hamburg, Germany, January 29-30, 2020.
Roder M., Steiner J., Nguyen B. D., Haaga S., Kabukcuoglu M., Bode S., Hänschke D., Baumbach T., Wellmann P., Sandfeld S., and Danilewsky. A.,
X-ray analysis of defects in 4H-SiC,
Deutsche Kristallzüchtungstagung DKT-2020, München-Garching, March 11-13, 2020.
Gradwohl K. P., Gybin K., Janicsko-Csathy J., Juda U., Schmidbauer M., Sumathi M., Roder M., and Danilewsky A. N.,
Vacancy clustering in dislocation-free high-purity germanium,
18th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII), Berlin, Germany, September 8-12, 2019.
Gradwohl K. P., Gybin K., Janicsko-Csathy J., Juda U., Roder M., Danilewsky A. N., Schmidbauer M., Abrosimov N., Kießling F.-M., and Sumathi M.,
Investigation of dislocation networks in high-purity germanium for detector applications,
3rd German Polish Conference on Crystal Growth, GPCCG-3, Poznan, Poland, March 17-21, 2019.
Kabukcuoglu M., Hänschke D., Bode S., Haaga S., Hamann E., Helfen L., Hurst M., Bacumbach T., and Danilewsky A.,
3D Investigation of the Thermal Evolution of Dislocations in Semiconductors by Means of X-ray Diffraction Imaging,
International Lectures on Crystal Growth, Berlin, Germany, December 09-13, 2019.
Kabukcuoglu M., Hänschke D., Bode S., Haaga S., Hamann E., Helfen L., Roder M., Danilewsky A., and Baumbach T.,
X-ray Laminography and its Extension for the quasi in situ Chacterization of Crystal Defects and their Dynamics,
MML Workshop at HZDR, February 13-15, 2019.
Roder M., Wellmann P., Steiner J., Arzig M., Kabukcuoglu M., Haaga S., and Danilewsky A. N.,
Influence on defects and lattice strain of 4H-SiC with varying growth conditions, DGKK-Arbeitskreis Herstellung und Charakterisierung von massiven Halbleiterkristallen,
Berlin, Germany, October 9-10, 2019.
Roder M.,
Defect Characterization of 4H-SiC with with Synchrotron Topography and High Resolution Diffractrometry,
in 1st Joint Meeting of the Young Crystal Growers (jDGKK) & Young Crystallog-raphers (YC), Cologne, Germany, September 19-20, 2019.
Roder M., Danilewsky A. N., Wellmann P., Steiner J., and Arzig M.,
Influence of growth conditions on defect types and densities in 4H-SiC,
3rd German Polish Conference on Crystal Growth, GPCCG-3, Poznan, Poland, March 17-21, 2019.
Roder M., Wellmann P., Steiner J., Arzig M., and Danilewsky. A.,
Defect Characterization of 4H-SiC with Synchrotron White Beam X-ray Topography and High Resolution X-ray Diffractometry,
27th Annual Meeting of the German Crystallographic Society (DGK), Leipzig, Germany, March 5-8, 2019.
Steiner J., Roder M., Nguyen B. D., Sandfeld S., Danilewsky A. N., Wellmann P.,
Analysis of the basal plane dislocation density and thermomechanical stress during 100 mm PVT growth of 4H-SiC in Abstracts,
DGKK-Arbeitskreis Herstellung und Charakterisierung von massiven Halbleiterkristallen, Berlin, Germany, October 9-10, 2019.
Baumbach T., Hänschke D., Helfen L., Hamann E., Farago T., Bode S., Haaga S., Kabukcuoglu M., and Danilewsky A. N.,
3D Material Characterization by Laminographic Imaging: Status and Prospects,
German Conference for Research with Synchrotron Radiation, Neutrons and Ion Beams at Large Facilities (SNI 2018), Garching, Germany, September 17-19, 2018.
Hänschke D., Helfen L., Hamann E., Farago T., Bode S., Haaga S., Kabukcuoglu M., Danilewsky A., Baumbach T.,
3D Material Characterization by Laminographic Imaging: Status and Prospects,
German Conference for Research with Synchrotron Radiation, Neutrons and Ion Beams at Large Facilities (SNI), Münich, Germany, Sept. 17-19, 2018
Haaga S., Hänschke D., Bode S., Kabukcuoglu M., Hamann E., Helfen L., Roder M., Hurst M., Baumbach T., Danilewsky A.,
3D Imaging of Crytstalline Defects in Various Semiconducting Materials by X-ray Diffraction Laminography,
14th Biennial Conference on High Resolution X-ray Diffraction and Imaging (XTOP), Bari, Italy, Sept. 3-7, 2018
Bode S., Hänschke D., Haaga S., Kabukcuoglu M., Hamann E., Helfen L., Danilewsky A., Baumbach T.,
Enabling Quasi 4D Imaging of Dislocation Dynamics in Semiconductor Wafers by X-ray Diffraction Laminography,
14th Biennial Conference on High Resolution X-ray Diffraction and Imaging (XTOP), Bari, Italy, Sept. 3-7, 2018
Kabukcuoglu M., Hänschke D., Bode S., Haaga S., Hamann E., Helfen L., Baumbach T., Danilewsky A.,
Investigation Dislocation Dynamics in Silicon Wafers by Means of X-ray Diffraction Laminography,
14th Biennial Conference on High Resolution X-ray Diffraction and Imaging (XTOP), Bari, Italy, Sept. 3-7, 2018
Hänschke D., Bode S., Kabukcuoglu M., Haaga S., Hamann E., Helfen L., Danilewsky A., Baumbach T.,
3D Characterization of Crystal Defects by X-ray Diffraction Laminography: Status and Prospects,
14th Biennial Conference on High Resolution X-ray Diffraction and Imaging (XTOP), Bari, Italy, Sept. 3-7, 2018
Bode S., Hänschke D., Hamann E., Kabukcuoglu M., Haaga S., Helfen L., Danilewsky A. N., Baumbach T.,
Extension of X-Ray Diffraction Laminography: A 4D Imaging Method for the Investigation of Defect Dynamics in Crystalline Materials,
26th Annual Meeting of the German Crystallographic Society (DGK), Essen, Germany, March 5-8, 2018.
Fritsch P., Kabukcuoglu M. P., Haaga S., Baumbach T., Danilewsky A. N.,
In-situ Observation of Dislocations in GaAs during Annealing Process by Means of Synchrotron White Beam X-ray Topography,
1st German-Austrian Conference on Crystal Growth (GACCG/DKT), Vienna, Austria, Feb. 14-16, 2018.
Fritsch P., Kabukcuoglu M. P., Haaga S., Baumbach T., Danilewsky A. N.,
In situ Studies of Dislocations in GaAs with Synchrotron White Beam X-ray Topography,
26th Annual Meeting of the German Crystallographic Society (DGK), Essen, Germany, March 5-8, 2018.
Haaga S., Hänschke D., Hamann E., Kabukcuoglu M., Bode S., Helfen L., Baumbach T., Danilewsky A. N.,
3D Imaging of Crystalline Defects in High Absorbing Semiconductor Materials with X-Ray Diffraction Laminography on the Example of GaAs Wafers,
26th Annual Meeting of the German Crystallographic Society (DGK), Essen, Germany, March 5-8, 2018.
Jauß T., Danilewsky A. N., Sorgenfrei T., Reimann C., Friedrich J.,
Synchrotron White Beam X-ray Topography Investigation of Particle Incorporation in Silicon,
1st German-Austrian Conference on Crystal Growth (GACCG/DKT), Vienna, Austria, Feb. 14-16, 2018.
Kabukcuoglu M., Hänschke D., Hamann E., Bode S., Haaga S., Helfen L., Baumbach T., Danilewsky A. N.,
4D Investigation of the Dislocation Propagation and their Interaction Depending on Thermal Stress by Means of X-ray Diffraction Laminography,
26th Annual Meeting of the German Crystallographic Society (DGK), Essen, Germany, March 5-8, 2018 - Poster Award.
Roder M., Danilewsky A. N., Wellmann P.,
Defect and Strain Characterization of 4H-SiC,
26th Annual Meeting of the German Crystallographic Society (DGK), Essen, Germany, March 5-8, 2018.
Roder M., Danilewsky A. N., Wellmann P.,
Characterisation of Defects and Strain in 4H-SiC,
1st German-Austrian Conference on Crystal Growth (GACCG/DKT), Vienna, Austria, February 14-16, 2018.
Bode S., Kabukcuoglu M., Haaga S., Hamann E., Hänschke D., Helfen L., Danilewsky A., and Baumbach T.,
Imaging the Dynamics and 3D Structure of Dislocation Arrangements in Semiconductor Wafers by Means of X-Ray Diffraction Laminography,
17th Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP), Valladolid, Spain, October 8-12, 2017.
Danilewsky A. N., Rack A., Scheel M.,
Dislocation and crack dynamics in silicon analyzed by X-ray diffraction imaging,
TOPICAL DAY: Imaging and Image Analysis IX, Empa, Dübendorf, Schweiz, 2017.
Hänschke D., Danilewsky A., Hamann E., Bode S., Helfen L., Baumbach T.,
Correlated 3D Imaging of Dislocations: Insight into the Onset of Thermal Slip in Semiconductor Wafers,
25th Annual Meeting of the German Crystallographic Society (DGK), Karlsruhe, Germany, March 27. – 30, 2017.
Hänschke D., Hamann E., Bode S., Danilewsky A., Helfen L. and Baumbach T.,
Correlated 3D Imaging of Dislocations: Insight into the Onset of Thermal Slip in Semiconductor Wafers,
3rd biannual conference of the International Association of Computed Tomography (ICTMS), Lund, Sweden, June 26-30, 2017.
Kopmann A.,
Big Data Applications and Challenges for Photon Science,
Annual Meeting Matter and Technlogies, Darmstadt, Germany, January 1 – February 2, 2017.
Kopmann A.,
Integration of online processing with GPUs in data acquisition system for improved data quality and control,
5th ARD topical workshop on “ps - fs Electron and Photon Beams”, DESY Zeuthen, Germany, July 19-21, 2017.
Vogelgesang M.,
Fast and Modular Data Acquisition and Processing,
SEI 2017 - Tagung der Studiengruppe Elektronische Instrumentierung, Karlsruhe, Germany, April 3-5, 2017.
Vogelgesang M., et al.,
A heterogeneous FPGA/GPU architecture for real-time data analysis and fast feedback systems,
JACOW, Geneva, Switzerland, 2017.
Vogelgesang M.,
Introdution to UFO framework, CAMERA Workshop: Algorithms for Tomographic Reconstruction: State-of-the-Art and Future Goals,
Lawrence Berkeley National Laboratory, USA, November 8-10, 2017.
Asadchikov V. E., Alexeev P., Bessas D., Buzmakov A. V., Cecilia A., Chumakov A., Danilewsky A. N., Deryabin A. N., Härtwig J., Hermann R. P., Jafari A., Kanevsky V. M., Prokhorov I. A., Roshchin B. S., Sergueev I., Wille H. C.,
Growth of single crystal sapphire for applications in X-ray backscattering,
18th International Conference on Crystal Growth and Epitaxy (ICCGE), Nagoya, Japan, August 7-12, 2016.
Caselle M., Ardila Perez L. E., Chilingaryan S., Dritschler T., Kopmann A., Mohr H., Rota L., Vogelgesang M., Balzer M., and Weber M.,
High-speed, Low-latency Readout System with Real-time Trigger Based on GPUs,
IEEE RT2016, Padova, Italy, June 5-10, 2016.
Caselle M., Rota L., Ardila Perez L. E. , Balzer M., Dritschler T., Kopmann A., Mohr H., Vogelgesang M., and Weber M.,
A High-Speed DAQ Framework for Future High-Level Trigger and Event Building Clusters,
Topical Workshop on Electronics for Particle Physics (TWEPP) 2016, Karlsruhe, Germany, September 26-30, 2016.
Chilingaryan S., Caselle M, Dritschler T., Kopmann A., Shkarin A., Vogelgesang M.,
Performance-oriented instrumentation for high-speed imaging,
Workshop on Large-Scale Tomography, Szeged, Hungary, January 25-27, 2016
Chilingaryan S.,
Optimizing Algorithms for Parallel Architectures,
Topical Workshop on Parallel Computing for Data Acquisition and Online Monitoring, Karlsruhe, Germany, February 7-8, 2016.
Chilingaryan S.,
Efficient GPU-enabled computing infrastructure for high-speed data acquisition,
Annual Meeting Matter and Technlogies, Karlsruhe, March 8-10, 2016.
Chilingaryan S., Balzer M., Caselle M., Dritschler T., Kopmann A., Perez L., Rota L., Shkarin A., Tan Jerome N., and Vogelgesang M.,
UFO - A platform for high data rate instrumentation with GPUs,
EUCALL FPGA - GPU Workshop, European XFEL, Schenefeld, Germany, November 15-18, 2016.
Danilewsky A. N., Rack A., Scheel M.,
Ultra High Speed In-Situ Characterization of Defects in Single Crystals,
18th International Conference on Crystal Growth and Epitaxy (ICCGE), Nagoya, Japan, August 7-12, 2016.
Danilewsky A. N., Rack A., Scheel M.,
Towards Real Time X-Ray Imaging of Cracks and Fracture in Silicon,
13th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging (XTOP), Brno, Czech Republic, September 4-8, 2016.
Hänschke D., Baumbach T.,
Determinability of Dislocation Paths by 3D Diffraction Laminographic Imaging: Theoretical Considerations Leading to a New Extinction Rule,
13th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging (XTOP), Brno, Czech Republic, September 4-8, 2016.
Kopmann A., Chilingaryan S., Vogelgesang M., Dritschler T., Shkarin A., Shkarin R., dos Santos Rolo T., Farago T., van de Kamp T., Balzer M., Caselle M., Weber M., and Baumbach T.,
UFO – A Scalable Platform for High-Speed Synchrotron X-ray Imaging,
IEEE NSS, 29.10.-6.11.2016 Strassburg, France
Vogelgesang M.,
High-throughput data acquisition and processing for real-time x-ray imaging,
SPIE Optical Engineering and Applications, San Diego, USA, August 28 – September 1, 2016.
Vogelgesang M., et al.,
A heterogeneous FPGA/GPU architecture for real-time data analysis and fast feedback systems,
5th Int. Beam Instrumentation Conf.(IBIC'16), Barcelona, Spain, Sept. 13-18, 2016.
Vogelgesang M.,
High-speed tomography with UFO,
CAMERA Workshop: Algorithms for Tomographic Reconstruction: State-of-the-Art and Future Goals, Lawrence Berkeley National Laboratory, USA, November 9-11, 2016.
Vogelgesang M., Rota L., Zilio N., Caselle M., Ardila Perez L. E., and Weber M.,
A high-throughput readout architecture based on PCI-Express Gen3 and DirectGMA technology,
Proceedings TWEEP, 2015.
Vogelgesang M.,
Integrated GPU-based Data Analysis with the UFO framework,
PNI-HDRI Spring Meeting, Hamburg, Germany, April 13-14, 2015.
Theses
Roder M.,
Defect and Strain Characterization of 4H- SiC,
Masterthesis (Supervisors/Referees: 1. Prof. apl. Dr. A. Danilewsky, 2. Prof. Dr. P. Wellmann), Friedrich-Alexander-Universität Erlangen-Nürnberg, 2018.
Fritsch P.,
In situ Studies of Dislocations in GaAs with White Beam Synchrotron X-ray Topography,
Masterthesis (Supervisors/Referees: 1. Prof. apl. Dr. A. Danilewsky, 2. Prof. apl. Dr. M. Fiederle), University of Freiburg, 2018.
Reinke A.,
Accurate reconstruction of dislocation maps in thin mono-crystallic wafers imaged using X-ray diffraction laminography,
Masterthesis (Referee: Prof. Dr. M. Weber, Supervisor: Dr. S. Chilingaryan), KIT, 2016.
Internships
Brunet M.,
Investigation of optimal system setups for lowest latency GPU data transfer in scientific application,
Internship, Grenoble Institute of Technology, 2017.
Buldygin R.,
Advanced image reconstruction algorithms for X-ray micro-tomography, Internship, Tomsk Polytechnic University, 2015.
Gökdemir G.,
Optimizing Direct Fourier Inversion algorithm for the latest GPU architectures,
Internship, University of Applied Sciences Mannheim, 2015.
